A Customized On-die Oscilloscope for Monitoring of Noise Waveforms inside IC Due to ESD

  • Zakirbek Mamatair uulu UNIST
  • Jung Hoon Cho Ulsan National Institute of Science and Technology
  • Sang Yeong Jeong Ulsan National Institute of Science and Technology
  • Jin Gook Kim Ulsan National Institute of Science and Technology
Keywords: Analog-to-Digital Converter(ADC), Binary counter, Delay Locked Loop(DLL), Electrostatic Discharge(ESD), ESD Detector, Linear regulator, Monitoring IC, On-die oscilloscope, Reconstruction, Sampling, Shift register, Transmission Line Pulse(TLP)

Abstract

An on-die oscilloscope circuit is proposed to monitor the power noise waveforms inside IC due to the electrostatic discharge (ESD) events for a more complete analysis of the effects of the ESD on the electronic systems. When an ESD event occurs, the induced noise voltage waveform in the power supply is sampled and converted to digital data in real time. A signal created by the ESD detector circuit is used to hold the digital data. The stored digital data are read and converted back to the analog noise waveform based on the sampling process. The operation of each circuit block in the monitoring IC is analyzed and validated by measurement results. The power noise waveforms due to the ESD events are measured with a digital oscilloscope instrument using cables and directly sampled by the on-die oscilloscope. These sampled noises are converted and reconstructed into analog noise waveforms, and then compared to the noises measured by the digital oscilloscope.

Published
2022-04-01
How to Cite
Mamatair uulu, Z., Cho, J. H., Jeong, S. Y., & Kim, J. G. (2022). A Customized On-die Oscilloscope for Monitoring of Noise Waveforms inside IC Due to ESD. Journal of Integrated Circuits and Systems, 8(2). Retrieved from http://jicas.idec.or.kr/index.php/JICAS/article/view/99
Section
Articles