Compact Active EMI Filter for Reduction of CM Conducted Emission in High Power System Implemented by the Integrated Circuit

  • Sang Yeong Jeong Ulsan National Institute of Science and Technology
  • Jun Sik Park Samsung Electronics
  • Jin Gook Kim Ulsan National Institute of Science and Technology
DOI: https://doi.org/10.23075/jicas.2021.7.1.002
Keywords: Active EMI filter(AEF), Bipolar-CMOS-DMOS (BCD) process, Conducted Emission (CE), Electromagnetic interference (EMI), Integrated Circuits (ICs)

Abstract

This paper proposes the integrated circuit (IC) within the active EMI filter (AEF). The fully-isolated feed-forward current-sense current-compensation (CSCC) structure of the AEF is also proposed to achieve the robust reliability from electromagnetic susceptibility (EMS) to the designed IC. The noise attenuation performance is analyzed, and the design guides for the proposed AEF with IC are developed. The designed IC is fabricated by 180nm BCD process. The noise attenuation performance and stability are experimentally validated by vector network analyzer (VNA) measurement.

Author Biographies

Sang Yeong Jeong, Ulsan National Institute of Science and Technology

Sang Yeong Jeong received the B.S. degree in electrical engineering from the Ulsan National Institute of Science and Technology, Ulsan, South Korea, in 2015, where he is currently pursuing the Ph. D. degree. His current research interests include electromagnetic compatibility (EMC) problems in the power system and the noise reduction techniques by using integrated circuits (ICs).

Jun Sik Park, Samsung Electronics

Jun Sik Park received the B.S. and Ph.D. degrees in electrical engineering from the Ulsan National Institute of Science and Technology, Ulsan, South Korea, in 2014 and 2019, respectively. He is currently with the Memory business of Samsung electronics, Hwasung, South Korea. His current research interests include electrostatic interference and electrostatic discharge in both component-level and system-level.

Jin Gook Kim, Ulsan National Institute of Science and Technology

Jin Gook Kim (M’09-SM’15) received his B.S., M.S., and Ph.D. degrees in electrical engineering from Korea Advanced Institute of Science and Technology, Daejon, Korea, in 2000, 2002, and 2006, respectively. From 2006 to 2008, he was with DRAM design team in Memory Division of Samsung Electronics, Hwasung, Korea, as a senior engineer. From January 2009 to July 2011, he worked for the EMC Laboratory at the Missouri University of Science and Technology, Missouri, USA, as a postdoc fellow. In July 2011, he joined the Ulsan National Institute of Science and Technology (UNIST), Ulsan, Korea, where he is currently a professor. His current research interests include EMC, ESD, RF interference, and analog circuits design.

Homepage : https://jingook.unist.ac.kr/

Published
2020-12-31
How to Cite
Jeong, S. Y., Park, J. S., & Kim, J. G. (2020). Compact Active EMI Filter for Reduction of CM Conducted Emission in High Power System Implemented by the Integrated Circuit. Journal of Integrated Circuits and Systems, 7(1), 6-11. https://doi.org/10.23075/jicas.2021.7.1.002
Issue
Vol 7 No 1 (2021)
Section
Articles

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