A Temperature-Compensated LDO without External Reference for Compact SoC Design in 65nm CMOS

  • Beomsoo Kim Sungkyunkwan University
  • Yuli Han
  • Chanjung Park
  • Byungjae Kwag
  • Minwoo Kim
  • Sangbin Tae
  • Kunhee Cho
Keywords: CMOS, low-dropout regulator, embedded-voltage-reference

Abstract

This paper presents a low-dropout (LDO) regulator with an embedded voltage reference (EVR), designed for system-on-chip (SoC) architectures requiring highperformance operation. The proposed design integrates the
voltage reference directly into the error amplifier (EA), enabling the generation of a 0.95 V output from a 1.05 V input while maintaining a low temperature coefficient and robust loop stability. The circuit comprises a proportional-to-absolutetemperature (PTAT) current generator, an EVR-based EA, and a power MOSFET. The LDO has been implemented in 65nm CMOS process. The simulation results demonstrate a stable output voltage of 0.95 V with a TC of 218 ppm/°C over a wide temperature range from -60°C to 120°C. A peak current efficiency of 99.99 % is obtained, maintaining stable operation and current driving capability up to 220 mA.

Author Biographies

Beomsoo Kim, Sungkyunkwan University

 

 
Yuli Han

 

   
Chanjung Park

 

 
Kunhee Cho

 

 
Published
2025-10-01
How to Cite
Kim, B., Han, Y., Park, C., Kwag, B., Kim, M., Tae, S., & Cho, K. (2025). A Temperature-Compensated LDO without External Reference for Compact SoC Design in 65nm CMOS. Journal of Integrated Circuits and Systems, 11(4), 70-75. https://doi.org/10.23075/jicas.2025.11.4.012
Section
Articles