A Customized On-die Oscilloscope for Monitoring of Noise Waveforms inside IC Due to ESD

  • Zakirbek Mamatair uulu Ulsan National Institute of Science and Technology
  • Jung Hoon Cho Ulsan National Institute of Science and Technology
  • Sang Yeong Jeong Ulsan National Institute of Science and Technology
  • Jin Gook Kim Ulsan National Institute of Science and Technology
DOI: https://doi.org/10.23075/jicas.2022.8.2.003
Keywords: Analog-to-Digital Converter(ADC), Binary counter, Delay Locked Loop(DLL), Electrostatic Discharge(ESD), ESD Detector, Linear regulator, Monitoring IC, On-die oscilloscope, Reconstruction, Sampling, Shift register, Transmission Line Pulse(TLP)

Abstract

An on-die oscilloscope circuit is proposed to monitor the power noise waveforms inside IC due to the electrostatic discharge (ESD) events for a more complete analysis of the effects of the ESD on the electronic systems. When an ESD event occurs, the induced noise voltage waveform in the power supply is sampled and converted to digital data in real time. A signal created by the ESD detector circuit is used to hold the digital data. The stored digital data are read and converted back to the analog noise waveform based on the sampling process. The operation of each circuit block in the monitoring IC is analyzed and validated by measurement results. The power noise waveforms due to the ESD events are measured with a digital oscilloscope instrument using cables and directly sampled by the on-die oscilloscope. These sampled noises are converted and reconstructed into analog noise waveforms, and then compared to the noises measured by the digital oscilloscope.

Author Biographies

Zakirbek Mamatair uulu, Ulsan National Institute of Science and Technology

Zakirbek Mamatair uulu received the B.S. and M.S. degrees in electrical engineering from Ulsan National Institute of Science and Technology (UNIST), Ulsan, South Korea, in 2019 and 2021, respectively. His current research interests include analog circuits design, ESD, and wireless power transfer.

Jung Hoon Cho, Ulsan National Institute of Science and Technology

Jung Hoon Cho received the B.S. degree in electronic engineering from Gachon University, Seongnam, Republic of Korea, in 2021. He is currently working toward the M.S. degree in Ulsan National Institute of Science and Technology (UNIST), Ulsan, Korea. His research interests include analog circuits design, electro-magnetic interference, and wireless power transfer.

Sang Yeong Jeong, Ulsan National Institute of Science and Technology

Sang Yeong Jeong received the B.S. and Ph.D. degrees in electrical engineering from the Ulsan National Institute of Science and Technology, Ulsan, South Korea, in 2015 and 2021, respectively. From March 2021, he is currently working for the IC&EMC Laboratory at the Ulsan National Institute of Science and Technology, Ulsan, South Korea, as a postdoc fellow. His current research interests include electromagnetic compatibility (EMC) problems in the power system and the noise reduction techniques by using integrated circuits (ICs).

Jin Gook Kim, Ulsan National Institute of Science and Technology

Jin Gook Kim (M’09-SM’15) received his B.S., M.S., and Ph.D. degrees in electrical engineering from Korea Advanced Institute of Science and Technology, Daejon, Korea, in 2000, 2002, and 2006, respectively. From 2006 to 2008, he was with DRAM design team in Memory Division of Samsung Electronics, Hwasung, Korea, as a senior engineer. From January 2009 to July 2011, he worked for the EMC Laboratory at the Missouri University of Science and Technology, Missouri, USA, as a postdoc fellow. In July 2011, he joined the Ulsan National Institute of Science and Technology (UNIST), Ulsan, Korea, where he is currently a professor. His current research interests include EMC, ESD, RF interference, and analog circuits design.

Homepage : https://jingook.unist.ac.kr/

Published
2022-04-01
How to Cite
Mamatair uulu, Z., Cho, J. H., Jeong, S. Y., & Kim, J. G. (2022). A Customized On-die Oscilloscope for Monitoring of Noise Waveforms inside IC Due to ESD. Journal of Integrated Circuits and Systems, 8(2). https://doi.org/10.23075/jicas.2022.8.2.003
Issue
Vol 8 No 2 (2022)
Section
Articles