EIT System with Skip Pattern Application: Enhanced Target Image Reconstruction Methodology

  • Junho Park Dankook University
  • Nahm Koo Dankook University
Keywords: Electrical Impedance Tomography (EIT), EIDORS, Current stimulator, Biomedical Sensor

Abstract

This paper presents a method for implementing skip patterns in Electrical Impedance Tomography (EIT) systems, which improves upon the limitations of the conventional adjacent method in image reconstruction. By applying skip patterns, we achieve a more uniform current distribution, thereby enhancing the ability to reconstruct target images. This approach provides a flexible and efficient framework suitable for various EIT applications across multiple industries, including medical imaging and industrial process monitoring.

Author Biographies

Junho Park, Dankook University

Junho Park is currently pursuing his B.S. degree in electrical engineering from Dankook University, Yong-in, Korea, since 2020. He is currently conducting research on low-power IC design for biomedical devices, especially on EIT systems.

Nahm Koo, Dankook University

Nahmil Koo (S’19-M’21) received the B.S. degree in electrical engineering from Hanyang University, Seoul, South Korea in 2016, and the M. S. degree and the Ph.D degree in electrical engineering from Korea Advanced Institute of science and technology, Daejeon, South Korea in 2018 and 2021, respectively. From 2021 to 2023, he was a staff researcher at Samsung Advanced Institute of Technology in Suwon, South Korea, where he was involved in multi-modal neural recording SoC. Since 2023, he has been with the Department of Convergence Semiconductor Engineering, Dankook University, where he is currently an assistant professor. His main interests are integrated biomedical sensors and systems, which include ExG sensor, Bio-impedance sensor, electrical impedance tomography (EIT) sensor, and sensor security solutions.

Homepage : https://sites.google.com/dankook.ac.kr/dkuspic

Published
2025-04-01
How to Cite
Park, J., & Koo, N. (2025). EIT System with Skip Pattern Application: Enhanced Target Image Reconstruction Methodology. Journal of Integrated Circuits and Systems, 11(2), 40-44. https://doi.org/10.23075/jicas.2025.11.2.008
Section
Articles