On-Die Noise Monitoring Circuit for System-Level ESD

Kyunghoon Lee; Sangyeong   Jeong; Jingook Kim

doi:10.23075/jicas.2024.10.4.001

Kyunghoon Lee Ulsan National Institute of Science and Technology
Sangyeong Jeong Ulsan National Institute of Science and Technology
Jingook Kim Ulsan National Institute of Science and Technology

DOI: https://doi.org/10.23075/jicas.2024.10.4.001

Keywords: monitoring circuit, electrostatic discharge, differential mode, common mode

Abstract

Electrostatic discharge (ESD) poses a significant risk to electronic systems, potentially leading to operational malfunctions. Accurately assessing the noise waveforms induced within these systems is challenging due to various factors such as common mode (CM) noise, direct radiation coupling, and limited accessibility of external equipment. To tackle these hurdles, a novel approach involving an on-die monitoring circuit (OMC) has been proposed for integration within electronic systems. This embedded circuit enables precise measurement of noise without external interference. The OMC, can detect abnormal noise levels surpassing predefined thresholds on both signal and power networks, accurately capturing their waveforms. To validate its practicality, the OMC was implemented in a evaluation board and tested in ESD experiments. Unlike traditional oscilloscope equipment vulnerable to CM noise, the OMC successfully isolated and measured only the relevant differential mode (DM) noise generated within the system. This showcases its ability to isolate and quantify target DM noise even in complex environments, overcoming limitations of conventional equipment.

Author Biographies

Kyunghoon Lee, Ulsan National Institute of Science and Technology

Kyunghoon Lee received the B.S. degree in electronic engineering from Myong-ji University, Yongin, Republic of Korea, in 2021, and the M.S. degree in electrical engineering from Ulsan National Institute of Science and Technology (UNIST), Ulsan, Korea, in 2024.

His research interest includes analog circuits design, and electro-magnetic compatibility (EMC).

Sangyeong Jeong, Ulsan National Institute of Science and Technology

Sangyeong Jeong received the B.S. and Ph.D. degrees in electrical engineering from the Ulsan National Institute of Science and Technology, Ulsan, South Korea, in 2015 and 2021, respectively. Since March 2021, he has been working at the IC&EMC Laboratory at the Ulsan National Institute of Science and Technology, Ulsan, South Korea, as a postdoc fellow. He is also with EMcoretech Inc.. His current research interests include electromagnetic compatibility (EMC) problems in the power system and the noise reduction techniques by using integrated circuits (ICs).

Jingook Kim, Ulsan National Institute of Science and Technology

Jingook Kim (M’09-SM’15) received his B.S., M.S., and Ph.D. degrees in electrical engineering from Korea Advanced Institute of Science and Technology, Daejon, Korea, in 2000, 2002, and 2006, respectively. From 2006 to 2008, he was with DRAM design team in Memory Division of Samsung Electronics, Hwasung, Korea, as a senior engineer. From January 2009 to July 2011, he worked for the EMC Laboratory at the Missouri University of Science and Technology, Missouri, USA, as a postdoc fellow. In July 2011, he joined the Ulsan National Institute of Science and Technology (UNIST), Ulsan, Korea, where he is currently a professor. He is also with EMcoretech Inc.. His current research interests include EMC, ESD, RF interference, and analog circuits design.

Homepage : https://jingook.unist.ac.kr/