A Leakage-Tolerant 4.58µJ·ppm2 -FoMs Reconfigurable RC-to-Digital Converter for Multi-Sensor Readout

  • Dong Wook Kim Daegu Gyeongbuk Institute of Science and Technology https://orcid.org/0000-0002-4043-8395
  • Ho Yeong Han Daegu Gyeongbuk Institute of Science and Technology
  • Jung Hyup Lee Daegu Gyeongbuk Institute of Science and Technology
Keywords: Low phase noise, Jitter, Relaxation oscillator, Swing-boosting

Abstract

This brief presents a leakage-tolerant high-resolution reconfigurable RC-to-digital converter (R2CDC) that can readout multiple resistance/capacitance sensors using swing boosted period-modulation (SB-PM) front-end. This R2CDC employs SB-PM front-end and first-order noise shaping block that results in 23.03aF Abs. Resolution. Compared to the conventional design, the leakage current was reduced by at least 15.67 times. Implemented in a 0.18µm standard CMOS process, the proposed (R2CDC) consumes 56.38µA from a 1V supply, occupying an active area of 0.0275 mm2, achieving FoMs=4.58μJ∙ppm2, FoMw=0.359pJ/Step efficiency at a measurement time of 500µs.

Author Biographies

Dong Wook Kim, Daegu Gyeongbuk Institute of Science and Technology

Dong Wook Kim received the B.S. degree in the department of electrical and electronic engin-eering from Hongik University Seoul, Korea, in 2021, He is currently working toward the M.S. degree in the department of electrical engineering and computer science at Daegu Gyeongbuk Institute of Science & Technology Daegu, Korea. His research interest includes Analog-mixed signal ADC.

Ho Yeong Han, Daegu Gyeongbuk Institute of Science and Technology

Ho Yeong Han received a B.S. degree in the department of electrical and electronic engin-eering from Dankook University Yongin, Korea in 2020, and M.S. degree in the department of electrical engineering and computer science in Daegu Gyeongbuk Institute of Science & Technology Daegu, Korea in 2022. He is currently working at Samsung electronics. His research interest includes Analog Sensors.

Jung Hyup Lee, Daegu Gyeongbuk Institute of Science and Technology

Jung Hyup Lee received the B.S. degree in electrical and electronics engineering from Kyungpook National University, Daegu, Korea, in 2003, and the M.S. and Ph.D. degrees in electrical engineering from the Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Korea, in 2005 and 2011, respectively. In 2011, he joined the Institute of Microelectronics, Agency for Science, Technology, and Research (A*STAR), Singapore, where he was engaged in the development of high-speed wireless transceivers for biomedical applications and reference clock generators. Since 2016, he is an Associate Professor at the department of electrical engineering and computer science in Daegu Gyeongbuk Institute of Science & Technology Daegu, South Korea. His research interests include mixed-signal and analog circuits for low-power biomedical devices and PVT tolerant circuits.

Homepage : https://ins.dgist.ac.kr/

Published
2023-04-01
How to Cite
Kim, D. W., Han, H. Y., & Lee, J. H. (2023). A Leakage-Tolerant 4.58µJ·ppm2 -FoMs Reconfigurable RC-to-Digital Converter for Multi-Sensor Readout. Journal of Integrated Circuits and Systems, 9(2). https://doi.org/10.23075/jicas.2023.9.2.004
Section
Articles