Mamatair uulu, Z., Cho, J. H., Jeong, S. Y., & Kim, J. G. (2022). A Customized On-die Oscilloscope for Monitoring of Noise Waveforms inside IC Due to ESD. Journal of Integrated Circuits and Systems, 8(2). https://doi.org/10.23075/jicas.2022.8.2.003